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Author Damaceanu, M.-D. ♦ Rusu, R.-D. ♦ Bruma, M. ♦ Muller, A.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Polyimides ♦ Dielectric thin films ♦ Dielectric films ♦ Dielectric constant ♦ Dielectric losses ♦ Dielectric materials ♦ Temperature ♦ Dielectric measurements ♦ Frequency ♦ Dielectric loss measurement
Abstract Thin films based on siloxane-containing polyimides have been prepared by the drop-casting technique. These films with thickness of tens of micrometers were flexible and resisted to repeated bendings. Very thin films having the thickness in the nanometer range, with neat surface, without pinholes or cracks, were obtained, as well. The mechanical and dielectric properties of these polyimide films were measured and discussed.
Description Author affiliation: ¿Petru Poni¿ Institute of Macromolecular Chemistry, Aleea Gr. Ghica Voda 41A, Iasi, Romania (Damaceanu, M.-D.; Rusu, R.-D.; Bruma, M.) || National Institute for Research and Development in Microtechnologies, Erou Iancu Nicolae 126A,Bucharest, Romania (Muller, A.)
ISBN 9781424444137
ISSN 1545827X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-10-12
Publisher Place romania
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 763.00 kB
Page Count 4
Starting Page 351
Ending Page 354


Source: IEEE Xplore Digital Library