|Author||Damaceanu, M.-D. ♦ Rusu, R.-D. ♦ Bruma, M. ♦ Muller, A.|
|Source||IEEE Xplore Digital Library|
|Publisher||Institute of Electrical and Electronics Engineers, Inc. (IEEE)|
|Subject Domain (in DDC)||Technology ♦ Engineering & allied operations ♦ Applied physics|
|Subject Keyword||Polyimides ♦ Dielectric thin films ♦ Dielectric films ♦ Dielectric constant ♦ Dielectric losses ♦ Dielectric materials ♦ Temperature ♦ Dielectric measurements ♦ Frequency ♦ Dielectric loss measurement|
|Abstract||Thin films based on siloxane-containing polyimides have been prepared by the drop-casting technique. These films with thickness of tens of micrometers were flexible and resisted to repeated bendings. Very thin films having the thickness in the nanometer range, with neat surface, without pinholes or cracks, were obtained, as well. The mechanical and dielectric properties of these polyimide films were measured and discussed.|
|Description||Author affiliation: ¿Petru Poni¿ Institute of Macromolecular Chemistry, Aleea Gr. Ghica Voda 41A, Iasi, Romania (Damaceanu, M.-D.; Rusu, R.-D.; Bruma, M.) || National Institute for Research and Development in Microtechnologies, Erou Iancu Nicolae 126A,Bucharest, Romania (Muller, A.)|
|Educational Role||Student ♦ Teacher|
|Age Range||above 22 year|
|Educational Use||Research ♦ Reading|
|Education Level||UG and PG|
|Learning Resource Type||Article|
|Rights Holder||Institute of Electrical and Electronics Engineers, Inc. (IEEE)|
|Size (in Bytes)||763.00 kB|
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