Thumbnail
Access Restriction
Subscribed

Author Koumela, A. ♦ Mercier, D. ♦ Marcoux, C. ♦ Duraffourg, L. ♦ Purcell, S.T.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2012
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Temperature measurement ♦ Silicon ♦ Resonant frequency ♦ Q factor ♦ Frequency measurement ♦ Temperature distribution
Abstract High frequency Silicon NanoWire Resonators (SNWR) have been fabricated and their performances for time reference applications have been assessed. The SNWR have been designed to operate at different frequencies going from 55 MHz up to 300 MHz with quality factors higher than 2000 at room temperature under high vacuum. The measured temperature coefficient of frequency (TCF) for different SNWR is about 40 ppm over a range of temperature going from 4 K to 300 K. The evolution of the quality factor as function of temperature has also been measured as well as the Allan deviation for different nanowire lengths.
Description Author affiliation: CEA-LETI, Grenoble, France (Koumela, A.; Mercier, D.; Marcoux, C.; Duraffourg, L.) || LPMCN, Université Lyon I - CNRS, Lyon, France (Purcell, S.T.)
ISBN 9781457718212
ISSN 10756787
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2012-05-21
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781457718205
Size (in Bytes) 764.71 kB
Page Count 4
Starting Page 1
Ending Page 4


Source: IEEE Xplore Digital Library