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Author Hsiao, M.S.
Sponsorship EDAA
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Design automation ♦ Automatic testing ♦ Europe
Abstract This paper presents a new fault-independent method for maximizing local conflicting value assignments for the purpose of untestable faults identification. The technique first computes a large number of logic implications across multiple time-frames and stores them in an implication graph. Then, by maximizing conflicting scenarios in the circuit, the algorithm identifies a large number of untestable faults that require such impossibilities. The proposed approach identifies impossible combinations locally around each Boolean gate in the circuit, and its complexity is thus linear in the number of nodes, resulting in short execution times. Experimental results for both combinational and sequential benchmark circuits showed that many more untestable faults can be identified with this approach efficiently.
Description Author affiliation: Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA (Hsiao, M.S.)
ISBN 0769514715
ISSN 15301591
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2002-03-04
Publisher Place France
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 684.01 kB
Page Count 5
Starting Page 949
Ending Page 953


Source: IEEE Xplore Digital Library