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Author Daasch, W.R. ♦ Madge, R.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2005
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Statistical analysis ♦ Semiconductor process modeling ♦ Logic testing ♦ Semiconductor device testing ♦ Integrated circuit testing ♦ Production ♦ Equations ♦ Manufacturing processes ♦ Semiconductor device measurement ♦ Laboratories
Abstract This paper is the second of a three paper series on statistical analysis of deep-submicron semiconductor test data. The subjects of this paper are the models and methods for computing healthy die estimates of the test response. Production data are used to demonstrate the ideas in this paper. The conceptual skeleton for the analysis is the computed difference between the measurement and a data-driven model of the healthy response. Uni-variate and multi-variate estimates are used to show the potential of the concept. Within the framework of estimating healthy response it is shown that significant reductions of distribution variance can be obtained with a corresponding improvement in outlier detection
Description Author affiliation: Electr. & Comput. Eng., Portland State Univ., OR (Daasch, W.R.)
ISBN 0780390385
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-11-08
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 276.58 kB
Page Count 313
Starting Page 10
Ending Page 322

Source: IEEE Xplore Digital Library