Thumbnail
Access Restriction
Subscribed

Author Chia-Chou Yeh ♦ Demerdash, N.A.O.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2007
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Fault tolerance ♦ Variable speed drives ♦ Induction motors ♦ Thyristors ♦ Hardware ♦ Torque control ♦ Automotive components ♦ Surges ♦ Vehicles ♦ Propulsion ♦ SCR switch-faults ♦ Induction motor ♦ adjustable-speed drive ♦ soft starter ♦ two-phase control ♦ fault-tolerant operation ♦ self-healing ♦ limp-home ♦ transistor switch-faults
Abstract Fault tolerant operations of soft starters and adjustable-speed drives (ASDs) when experiencing power switch open-circuit or short-circuit faults are presented in this paper. The present low-cost fault mitigation solutions can be retrofitted into the existing off-the-shelf soft starters and ASDs with only minimum hardware modifications. The fault tolerant soft starters are capable of operating in a two-phase mode under the condition of thyristor/SCR open-circuit or short-circuit switch-fault in any one of the phases using a novel resilient closed-loop control scheme. The performance resulted from the present soft starter fault tolerant control has demonstrated reduced starting motor torque transient and inrush current magnitude. As for the ASDs, a low-cost fault mitigation strategy for low-speed applications such as "self-healing/limp-home" needs for vehicles and propulsion systems, with capabilities for mitigating transistor open-circuit and short-circuit switch-faults was developed. The present fault tolerant drive topology requires only minimum hardware modifications to the conventional off-the-shelf six-switch three-phase drive, with only the addition of electronic components such as triacs and fast-acting fuses. In addition, the present approach offers the potential of mitigating not only transistor switch-faults but also drive related faults such as rectifier diode short-circuit fault or dc link capacitor fault. Given in this paper is a complete set of simulation results that demonstrate the soundness and effectiveness of the present fault tolerant approaches.
Description Author affiliation: Marquette Univ., Milwaukee (Chia-Chou Yeh; Demerdash, N.A.O.)
ISBN 9781424406548
ISSN 02759306
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2007-06-17
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 503.28 kB
Page Count 8
Starting Page 1942
Ending Page 1949


Source: IEEE Xplore Digital Library