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Author Rockoff, T.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1998
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword System testing ♦ Software testing ♦ Circuit testing ♦ System software ♦ Hardware ♦ Manufacturing industries ♦ Electronics industry ♦ Semiconductor device manufacture ♦ Computer architecture ♦ Digital circuits
Abstract For the semiconductor industry to continue to achieve its product quality and life cycle goals, ATE manufacturers need to re-think system architecture. Conventional ATE system software creates an initial state for the complex digital circuits that execute a test, and later reports results. But during the execution of a test, conventional ATE system software lies inactive, awaiting completion of the test system hardware's arcane dance. If the ATE manufacturers are able to draw on the lessons learned over several decades in the parallel computing industry, then future ATE will include system software that manages test system hardware resources dynamically at a fine grain throughout test execution. Such flexibility of test system operation is an improvement dimension that is not reflected in the SIA Roadmap. Flexibility opens the door to increased functional capability, reduced time-to-market for families of ATE, reduced hardware costs, and simplified test development. Improvement in this new dimension will allow ATE to achieve the SIA's long-term performance projections.
Description Author affiliation: SIMD Solutions Inc., USA (Rockoff, T.)
ISBN 0780350936
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1998-10-18
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 122.35 kB


Source: IEEE Xplore Digital Library