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Author Malagu, C. ♦ Comini, E. ♦ Ottini, L. ♦ Guidi, V. ♦ Maffeis, T.G.G. ♦ Martinelli, G. ♦ Sberveglieri, G. ♦ Wilks, S.P.
Sponsorship IEEE Sensors Council
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2003
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Tunneling ♦ Spectroscopy ♦ Gas detectors ♦ Surface morphology ♦ Atomic force microscopy ♦ Scanning electron microscopy ♦ Surface topography ♦ Sociotechnical systems ♦ Physics ♦ Image resolution
Abstract We collected high resolution scanning tunneling (STM) images on thin films of WO/sub 3/. This provided information about the morphology and the nanostructure of the samples. The surface gap was then determined through scanning tunneling spectroscopy (STS) and was found to be much narrower than the bulk gap determined via photoluminescence. This effect is a consequence of the high density of surface states in this material. Pinning of the Fermi level due to these states is decreased when the sample is illuminated at low temperature, whereas at high temperature the effect is masked by the high density of free carriers.
Description Author affiliation: Dept. of Phys., INFM, Ferrara, Italy (Malagu, C.)
ISBN 0780381335
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2003-10-22
Publisher Place Canada
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 295.67 kB
Page Count 4
Starting Page 899
Ending Page 902

Source: IEEE Xplore Digital Library