Access Restriction

Author Sweeney, J.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1990
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Manufacturing processes ♦ Virtual manufacturing ♦ Fault detection ♦ Instruments ♦ System testing ♦ Silicon ♦ Pins ♦ Delay ♦ Assembly ♦ Robustness
Abstract The author describes two test features in the VAX 6000 model 400 processor which help test and diagnose the module in a manufacturing environment. The continuity transistor structure allows an in-circuit tester to detect and diagnose open faults between the chips and the board using analog instrumentation. The observe boundary scan feature is designed to help detect and diagnose faults during full-speed system test. The overhead caused by both of these test features is negligible in terms of additional silicon area, device pins, and signal delay. The test features combined with a well-controlled assembly process and a very robust design have allowed the VAX 6000 model 400 processor to be manufactured economically.
Description Author affiliation: Digital Equipment Corp., Andover, MA, USA (Sweeney, J.)
ISBN 081869064X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1990-09-10
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 429.34 kB
Page Count 6
Starting Page 109
Ending Page 114

Source: IEEE Xplore Digital Library