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Author Jihun Jung ♦ Ansari, M.A. ♦ Dooyoung Kim ♦ Hyunbean Yi ♦ Sungju Park
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2015
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Aging ♦ Monitoring ♦ Flip-flops ♦ Timing ♦ Estimation ♦ Clocks ♦ Power demand ♦ on-line test ♦ aging monitoring ♦ scan flip-flop
Abstract The semiconductor aging is one of the serious threats for the reliability of the system. This paper presents an efficient mechanism for predicting the aging effect. The captured data will be unloaded by shift operation, then verified through the aging monitoring operation. Especially the aging level of automotive semiconductor devices can be estimated by controlling the capture timing. Since the aging monitoring function is efficiently on and off during normal operation, power consumption can be reduced significantly compared with other approaches.
Description Author affiliation: Dept. of Comput. Eng., Hanbat Nat. Univ., Daejeon, South Korea (Hyunbean Yi) || Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea (Jihun Jung; Ansari, M.A.; Dooyoung Kim; Sungju Park)
ISBN 9781479976034
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2015-05-25
Publisher Place Romania
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 328.41 kB
Page Count 2
Starting Page 1
Ending Page 2

Source: IEEE Xplore Digital Library