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Author Sessler, G.M. ♦ Yang, G.M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1995
Language English
Subject Keyword Electron beams ♦ Conductivity ♦ Temperature ♦ Current measurement ♦ Charge measurement ♦ Time measurement ♦ Laser modes ♦ Laser theory ♦ Laser transitions ♦ Delay
Abstract Teflon and Kapton films of 25 /spl mu/m thickness are charged with 30 keV and 20 keV electron beams, respectively, to charge densities of 100 nC/cm/sup 2/. Thereafter, the charge distribution in the depth direction and its change with time at 120/spl deg/C are measured with the laser-induced pressure-pulse (LIPP) method. A theoretical model of charge buildup during electron-beam irradiation and charge transport thereafter, considering the charge deposition and dose profiles, the radiation-induced conductivity and the carrier mobility is used to interpret the experimental data. While the charge transport at room temperature is mostly due to the direct and delayed radiation-induced conductivity and is therefore limited to the volume penetrated by the electron beam, charge motion at elevated temperatures is also caused by increased carrier mobility in the nonirradiated volume. Evaluations yield numerical values for the charge transport parameters, such as Schubweg, mobility-lifetime product, and trap density.
Description Author affiliation: Tech. Univ. Darmstadt, Germany (Sessler, G.M.; Yang, G.M.)
ISBN 0780329317
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1995-10-22
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 389.59 kB
Page Count 4
Starting Page 630
Ending Page 633

Source: IEEE Xplore Digital Library