Thumbnail
Access Restriction
Subscribed

Author Hamid, A.S. ♦ Holloway, A.F. ♦ Hassan, A. ♦ Nabok, A.
Sponsorship IEEE
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2015
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Films ♦ Zinc ♦ Sensors ♦ Coatings ♦ Chemicals ♦ Sensitivity ♦ Crystals ♦ gas sensor ♦ QCM ♦ Impedance analysis ♦ zinc phthalocyanine
Abstract A Quartz Crystal Microbalance (QCM) with 1 0 MHz fundamental resonance was used as the sensing element(s) to monitor changes in the properties of Zinc Phthalocyanine (ZnPc) films caused by adsorption of different types of selected organic vapour, such as hexane and benzene. The experimental admittance spectra of (QCM) around resonance were fitted to an equivalent circuit model (BVD circuit) and parameters relating to film thickness and viscosity were extracted. LabVIEW software was used to control the experimental setup and curve fitting. (ZnPc) films with a range of different substitutes were studied. Additionally, characterization of the film properties has been carried out using parameters obtained from QCM measurements in conjunction with suitable data analysis and modeling techniques. Validation of the film properties has been established (thickness and structure) using complementary existing methods such as AFM and Ellipsometry.
Description Author affiliation: Mater. Eng. Res. Inst., Sheffield Hallam Univ., Sheffield, UK (Hamid, A.S.) || Mater. Eng. Res. Inst., Sheffield, UK (Holloway, A.F.; Hassan, A.; Nabok, A.)
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2015-11-01
Publisher Place South Korea
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781479982035
Size (in Bytes) 344.16 kB
Page Count 4
Starting Page 1
Ending Page 4


Source: IEEE Xplore Digital Library