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Author Haneda, K. ♦ Takada, J.-i. ♦ Takizawa, K.-i. ♦ Vainikainen, P.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Antenna measurements ♦ Performance evaluation ♦ Parameter estimation ♦ Array signal processing ♦ Area measurement ♦ Scattering ♦ Displacement measurement ♦ Position measurement ♦ Antennas and propagation ♦ Ultra wideband technology
Abstract Ultrawideband (UWB) spatio-temporal area propagation measurement and modeling was performed for accurate characterization of spatial UWB channels. The area propagation measurement acquires as much channel data as possible in one specific environment, e.g., in an office room, to characterize the variation of the dominant scattering process against antenna position displacement. The spatio-temporal channel modeling includes propagation path detection, parameter estimation, and path tracking. A simple spatio-temporal beamforming was considered for path detection and parameter estimation. The path tracking is capable of distinguishing meaningful propagation paths from insignificant ones, and also of clustering propagation paths. The modeling results agreed very well with physical scattering processes, and therefore, the method was proven to be reliable.
Description Author affiliation: SMARAD Centre of Excellence, Helsinki University of Technology (TKK), Finland (Haneda, K.; Vainikainen, P.) || Medical ICT Group, National Institute of Information and Communications Technology, Japan (Takada, J.-i.; Takizawa, K.-i.)
ISBN 9781424429301
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-09-09
Publisher Place Canada
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 811.20 kB
Page Count 6
Starting Page 326
Ending Page 331

Source: IEEE Xplore Digital Library