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Author Gruber, D. ♦ Ostermann, T.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2012
Language English
Subject Domain (in DDC) Social sciences ♦ Commerce, communications & transportation ♦ Communications; telecommunication ♦ Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics
Subject Keyword Calibration ♦ Temperature measurement ♦ System-on-a-chip ♦ Semiconductor device measurement ♦ Voltage measurement ♦ Resistors ♦ Temperature dependence ♦ programmable ♦ voltage reference ♦ calibration ♦ temperature coefficient ♦ offset voltage
Abstract We present an on-chip calibration method for reducing offset errors and variations of the temperature coefficient of the output voltage of a programmable voltage reference. The offset calibration can be performed by an automatic on-chip calibration procedure or by directly programming an appropriate calibration value via a Three-Wire-Interface. Variation of the temperature coefficients can be compensated by taking into account the measured output voltage at two arbitrary temperatures during e.g. wafer sort and final test, and setting a corresponding calibration value. Extensive simulations and measurements indicate that the error due to variations in temperature coefficients can be reduced by 40% and the overall offset error can be improved up to 90% of the uncalibrated voltage reference.
Description Author affiliation: Institute for Integrated Circuits, JKU - Johannes Kepler University Linz, Linz, Austria (Gruber, D.; Ostermann, T.)
ISBN 9781457711169
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2012-03-14
Publisher Place Mexico
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781457711176
Size (in Bytes) 221.77 kB
Page Count 4
Starting Page 1
Ending Page 4


Source: IEEE Xplore Digital Library