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Author Huan-Chih Tsai ♦ Kwang-Ting Cheng ♦ Chih-Jen Lin ♦ Bhawmik, S.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1997
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword Built-in self-test ♦ Circuit testing ♦ Circuit faults ♦ Cost function ♦ Permission ♦ Timing ♦ Circuit simulation ♦ Hardware ♦ Test pattern generators ♦ Circuit analysis
Description Author affiliation: University of California (Huan-Chih Tsai)
ISBN 0780340930
ISSN 0738100X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1997-06-09
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 722.33 kB
Page Count 6
Starting Page 478
Ending Page 483

Source: IEEE Xplore Digital Library