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Author Bucheru, B.T.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1997
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Automotive engineering ♦ Semiconductor diodes ♦ High temperature superconductors ♦ Performance evaluation ♦ Materials testing ♦ Thermal degradation ♦ Virtual reality ♦ Rectifiers ♦ Semiconductor devices ♦ Vehicle dynamics
Abstract An investigation upon a method for screening and quick estimate of the reliability of automotive rectifier diodes in the DO21 case is presented. The aim was to analyse if the standard tests, RTV (rapid thermal variations) and HTS (high temperature storage), can constitute a good estimate of reliability of diodes. One aimed to reach to a better interpretation of test results and the choice of efficient screening method.
Description Author affiliation: S.C. Baneasa S.A., Bucharest, Romania (Bucheru, B.T.)
ISBN 0780338049
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1997-10-07
Publisher Place Romania
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 229.85 kB
Page Count 4
Starting Page 335
Ending Page 338

Source: IEEE Xplore Digital Library