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Author Bizopoulos, P.A. ♦ Al-Ani, T. ♦ Tsalikakis, D.G. ♦ Tzallas, A.T. ♦ Koutsouris, D.D. ♦ Fotiadis, D.I.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2013
Language English
Subject Domain (in DDC) Technology ♦ Medicine & health ♦ Engineering & allied operations
Subject Keyword Electroencephalography ♦ Barium ♦ Electrooculography ♦ Empirical mode decomposition ♦ Pollution measurement ♦ Data analysis ♦ Correlation coefficient
Abstract Electrooculographic (EOG) artefacts are one of the most common causes of Electroencephalogram (EEG) distortion. In this paper, we propose a method for EOG Blinking Artefacts (BAs) detection and removal from EEG. Normalized Correlation Coefficient (NCC), based on a predetermined BA template library was used for detecting the BA. Ensemble Empirical Mode Decomposition (EEMD) was applied to the contaminated region and a statistical algorithm determined which Intrinsic Mode Functions (IMFs) correspond to the BA. The proposed method was applied in simulated EEG signals, which were contaminated with artificially created EOG BAs, increasing the Signal-to-Error Ratio (SER) of the EEG Contaminated Region (CR) by 35dB on average.
Description Author affiliation: Unit of Med. Technol. & Intell. Inf. Syst., Ioannina, Greece (Tzallas, A.T.) || Dept. of Inf. & Telecommun. Eng., Univ. of Western Macedonia, Kozani, Greece (Tsalikakis, D.G.) || LISV-Univ. de Versailles St.-Quentin-en-Yvelines, Versailles, France (Al-Ani, T.) || Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens (NTUA), Zografou, Greece (Koutsouris, D.D.) || Dept. Inf. et Telecommun., ESIEE-Paris, Noisy-Le-Grand, France (Bizopoulos, P.A.) || Fac. of Mater. Sci. & Eng., Univ. of Ioannina, Ioannina, Greece (Fotiadis, D.I.)
ISBN 9781457702167
ISSN 1557170X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2013-07-03
Publisher Place Japan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 1.00 MB
Page Count 4
Starting Page 5853
Ending Page 5856

Source: IEEE Xplore Digital Library