Access Restriction

Author Botila, T. ♦ Pentia, E. ♦ Pintilie, L. ♦ Tivarus, C. ♦ Pintilie, I.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1990
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Lead ♦ Substrates ♦ Capacitance-voltage characteristics ♦ Dielectric measurements ♦ Photoconducting materials ♦ Sputtering ♦ Electrodes ♦ Voltage ♦ Ferroelectric films ♦ Photoconducting devices
Abstract PbS thin films were deposited on the Si/sub 3/N/sub 4//Si substrates. The electric properties of the sandwich structure, before and after PbS deposition, were investigated using C-V and I-V measurements. It was found that an anomalously high leakage current occurs through the structure after PbS deposition.
Description Author affiliation: Nat. Inst. if Mater. Phys., Bucharest, Romania (Botila, T.)
ISBN 0780351398
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1999-10-05
Publisher Place Romania
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 260.19 kB
Page Count 4
Starting Page 511
Ending Page 514

Source: IEEE Xplore Digital Library