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Author Aikyo, T.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword System-on-a-chip ♦ Noise ♦ Fault diagnosis ♦ Delay ♦ Microscopy ♦ Testing ♦ Design automation ♦ fault candidates ♦ test ♦ diagnosis ♦ variation ♦ power-supply noise
Abstract The progress in miniaturization of semiconductor process technology has brought new issues to SoC test in 32nm technology and beyond. The increasing variation due to the semiconductor miniaturization causes the increase of parametric failures. As a result, the conventional test technology is suffering from the loss of test quality and the increase of test cost. In addition, there is increasing number of SoCs used in portable products running on battery and so new low-power design technologies are emerging. In order to cope with this evolution, new test technologies for such low-power design are required. Also, some test technologies considering power-supply noise is becoming important for the low-power SoCs, since the margin of power-supply noise is small. Furthermore, it becomes important to investigate the cause of failures. Especially for delay defects, it becomes difficult to identify the cause of failures by physical analysis such as a light emission microscopy. So it is important to reduce the number of fault candidates by a fault diagnosis tool. In STARC, we have been developing a test and diagnosis platform, STARCAD-Clouseau, to solve the above problems related to test and diagnosis. In this keynote, I will show some of our research activities for variation-aware test, power and noise aware test, and fault diagnosis.
ISBN 9781424484478
ISSN 15505774
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-10-06
Publisher Place Japan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 85.55 kB
Page Count 1
Starting Page 227
Ending Page 227


Source: IEEE Xplore Digital Library