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Author Xiaowei Zhang ♦ Donggang Cao ♦ Yunpeng Gao ♦ Xiangqun Chen ♦ Hong Mei
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Real time systems ♦ Throughput ♦ Time factors ♦ Instruction sets ♦ Stochastic processes ♦ Production facilities ♦ Java ♦ integer programming ♦ real-time applications ♦ throughput ♦ determinism ♦ stochastic process
Abstract Determinism and throughput are two important performance measures for Java-based real-time applications, but they often conflict. Therefore, it is significant to improve throughput for Java-based real-time applications while guaranteeing its execution time determinism. In this paper, we propose an automatic configuration approach to assign real-time thread priorities to solve the above-mentioned problem. In this approach, we propose an innovative representation of determinism related with real-time thread priorities using stochastic process. Java-based real-time application’s throughput is quantified with thread priorities as parameters. The algorithm of integer programming is used to optimize throughput with boundary conditions of the level of determinism. Finally, the Sweet Factory application is tested to evaluate the effect of our approach. Experiment results show that throughput for Java-based real-time applications could be efficiently improved while keeping the execution time determinism with our approach.
ISBN 9781424475124
ISSN 07303157
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-07-19
Publisher Place Korea (South)
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781424475131
Size (in Bytes) 386.00 kB
Page Count 10
Starting Page 443
Ending Page 452


Source: IEEE Xplore Digital Library