Access Restriction

Author Abbas, M. ♦ Ikeda, M. ♦ Asada, K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2006
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Detectors ♦ Circuit noise ♦ Noise measurement ♦ Semiconductor device measurement ♦ Bandwidth ♦ Monitoring ♦ Voltage ♦ Fluctuations ♦ Event detection ♦ Testing
Abstract In this paper we present an overview of an on-chip noise detection circuit. Mainly, this work is different form the previous works concerning on-chip noise measurement in one or more of the following: First: it does not assume specific noise properties such as periodicity. Second: the requested bandwidth of the output channel can be adjusted freely, therefore, the user can avoid the effect of on-chip parasites and the need to off-chip sophisticated monitoring tools. Third: the detector is equipped with an on-chip voltage divider, which enables measuring the high and low swing fluctuations accurately. Therefore, the detector is suitable to measure the non-periodic /single event noise for the purpose of reliability evaluation and performance modeling. A slower version of the detector is implemented in a test chip using Hitachi 0.18mum technology
Description Author affiliation: Dept. of Electron. Eng., Tokyo Univ. (Abbas, M.; Ikeda, M.; Asada, K.)
ISBN 3981080114
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-03-06
Publisher Place Germany
Rights Holder European Design Automation Association (EDAA)
Size (in Bytes) 127.93 kB
Page Count 2
Starting Page 1
Ending Page 2

Source: IEEE Xplore Digital Library