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Author Rajski, J. ♦ Cox, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1990
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Test pattern generators ♦ Circuit testing ♦ Logic circuits ♦ Circuit faults ♦ Iterative algorithms ♦ System testing ♦ Adders ♦ Libraries ♦ Logic testing ♦ Boolean algebra
Abstract The authors present a novel test pattern generation algorithm which uses the concept of necessary assignments to reduce or eliminate backtracking in automatic test pattern generation. Necessary assignments are those which must be made in order to find a test pattern; without them the search is guaranteed to fail. The algorithm is based on the mathematical concept of images and inverse images of set functions. In order to take advantage of formal concepts developed for Boolean algebras, the algorithm uses a 16-valued algebra. It has been used to generate test patterns for all faults in a variety of benchmark circuits. Experimental results indicate that the algorithm is particularly efficient at redundancy identification, which is often a problem for conventional test pattern generation algorithms. The benefits of a 16-valued system are illustrated through examples of faults which are not properly handled by conventional 5- or 9-valued systems.
Description Author affiliation: Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada (Rajski, J.; Cox, H.)
ISBN 081869064X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1990-09-10
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 815.72 kB
Page Count 10
Starting Page 25
Ending Page 34


Source: IEEE Xplore Digital Library