Thumbnail
Access Restriction
Subscribed

Author Tilgner, M. ♦ Ishida, M. ♦ Yamaguchi, T.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1997
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Data compression ♦ Circuit testing ♦ Very large scale integration ♦ Laboratories
Abstract Summary form only given. A simple algorithm for efficient lossless compression of circuit test data with fast decompression speed is presented. It can easily be converted into a VLSI implementation. The algorithm is based on recursive block structured run-length coding and compresses at ratios of about 6:1 to 1000:1, higher than most of the widely known compression techniques.
Description Author affiliation: Dept. of Math. & Comput. Sci., Tokyo Inst. of Technol., Japan (Tilgner, M.)
ISBN 0818677619
ISSN 10680314
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1997-03-25
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 86.39 kB


Source: IEEE Xplore Digital Library