Access Restriction

Author Maeda, A.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2007
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Production ♦ System testing ♦ Signal to noise ratio ♦ Bandwidth ♦ Noise figure ♦ Noise measurement ♦ Power supplies ♦ Noise reduction ♦ Frequency ♦ Performance evaluation
Abstract The noise floor is the noise distributed all of the frequency range and it does not include the spurious. At the test system, GNDs, power supplies and test modules have their own noise floor and the total sum of these noise floors affects the device test. The GND noise floor is hard to deal with because it is common mode noise and it is not easy to remove.
Description Author affiliation: Verigy Japan K.K., Tokyo (Maeda, A.)
ISBN 9780769528908
ISSN 10817735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2007-10-08
Publisher Place China
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 263.74 kB
Page Count 1
Starting Page 474
Ending Page 474

Source: IEEE Xplore Digital Library