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Author Crede, E. ♦ Borrego, M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Social sciences ♦ Education ♦ Technology ♦ Engineering & allied operations
Subject Keyword Instruments ♦ Interviews ♦ Cultural differences ♦ Educational institutions ♦ Medical services ♦ Engineering education ♦ mixed methods ♦ graduate education ♦ international students ♦ survey design
Abstract This study examines the experiences of one of engineering graduate schools largest populations: international students. This paper discusses the use of ethnographically guided observations and interviews in the development of a multi institution survey on graduate student experiences. The results of qualitative analysis will be briefly discussed to contextualize the survey sections and creation of individual questions. The development of this survey was the second part of a multi phase mixed methods study whose purpose was to investigate the role of international diversity in graduate engineering communities. Results of this study will help shape the future of graduate engineering education by bringing the experiences of both international and domestic graduate engineering students to the forefront. We conclude with implications for the current state of engineering graduate education as well as directions for future research.
Description Author affiliation: Graduate Program, Department of Engineering Education Virginia Tech (Borrego, M.) || Department of Engineering Education, Virginia Tech, 660 McBryde Hall (0218), Blacksburg VA 24061 (Crede, E.)
ISBN 9781424462612
ISSN 01905848
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-10-27
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781424462629
Size (in Bytes) 207.92 kB


Source: IEEE Xplore Digital Library