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Author Ihori, H. ♦ Oka, M. ♦ Nagaoka, Y. ♦ Fujii, M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2014
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics
Subject Keyword Dielectric measurement ♦ Lenses ♦ Pulse measurements ♦ Density measurement ♦ Time measurement ♦ Image reconstruction ♦ Q measurement ♦ remnant charge ♦ electric field ♦ space charge ♦ Kerr effect ♦ liquid dielectric
Abstract In dielectric liquids subjected to a high electric field, space charges are generated due to various reasons, for example, by the injection of charges from electrodes or by ionization of the impurities and molecules. It is necessary to obtain information regarding the electric field and space charge distributions in insulating materials to ensure effective insulation, however, it is very difficult to obtain information regarding space charge in liquid. We have investigated the electric field distributions in liquid dielectrics using the Kerr elctrooptic effect. Recently, the electric field distribution in the order of milli-seconds has been able to be measured. For 1 ms immediately after an applied voltage, it is thought that space charge layer is almost never formed. So, we measured the electric field distribution for 1ms at the applied voltage. Then, after a period of time, we measured again the electric field distribution at the second application of the voltage pulse. If there is a difference between the two, it is considered that it is caused by remnant electric charges. So, we report on the evaluation of the remnant charge in liquid.
Description Author affiliation: Ehime Univ., Matsuyama, Japan (Ihori, H.; Oka, M.; Nagaoka, Y.; Fujii, M.)
ISBN 9784886860866
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2014-06-01
Publisher Place Japan
Rights Holder The Institute of Electrical Engineers, Japan
Size (in Bytes) 799.81 kB
Page Count 4
Starting Page 342
Ending Page 345

Source: IEEE Xplore Digital Library