Thumbnail
Access Restriction
Subscribed

Author Srinivasa, A. ♦ Froyd, J.E. ♦ Guha, R.V.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2013
Language English
Subject Domain (in DDC) Social sciences ♦ Education ♦ Technology ♦ Engineering & allied operations
Subject Keyword Fault tolerance ♦ Fault tolerant systems ♦ Design methodology ♦ Mechanical engineering ♦ Educational institutions ♦ Robustness ♦ Scalability ♦ robustness ♦ curriculum design ♦ design ♦ flexibility ♦ fault tolerant ♦ function-behavior-structure framework
Abstract The paper considers how research in product/process design methodologies can be used to design engineering curricula. Following the Function-Behavior-Structure (FBS) framework for product design, we show how the curriculum design task can be separated into functionality of the curriculum, student behaviors and course structures. We then describe possible ways in which such a design could help us explore the possibilities of designing different types of curricula with the same functionality so that we could develop flexible, fault tolerant, scalable curricula that evolves with changing circumstances. These requirements are not generally included as curriculum design criteria and an approach that highlights the role of “robustness” would be useful.
Description Author affiliation: Google Fellow, Google, Inc., Mountain View, CA, USA (Guha, R.V.) || Eng. Student Services & Acad. Programs, Texas A&M Univ., College Station, TX, USA (Froyd, J.E.) || Dept. of Mech. Eng., Texas A&M Univ., College Station, TX, USA (Srinivasa, A.)
ISBN 9781467352611
ISSN 01905848
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2013-10-23
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 819.21 kB
Page Count 7
Starting Page 872
Ending Page 878


Source: IEEE Xplore Digital Library