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Author Namba, K. ♦ Ito, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Latches ♦ Manufacturing ♦ Logic gates ♦ Delay ♦ Built-in self-test ♦ MOSFETs ♦ reconfigurable C-element ♦ soft error tolerance ♦ DFT (design for test) ♦ BISER (built-in soft error resilience) ♦ BILBO (built-in logic block observer)
Abstract This paper presents a construction of a flip-flop (FF) that works as a soft error tolerant FF in system operations and as a BILBO (Built-In Logic Block Observer) FF in manufacturing testing. The construction of the proposed FF is based on that of an existing soft error tolerant FF, namely a BISER (Built-In Soft Error Resilience) FF. The proposed FF contains a reconfigurable C-element with XNOR calculation capability, which works as a C-element for soft error tolerance during system operations and as an XNOR gate employed in linear feedback shift registers (LFSRs) during manufacturing testing. This paper also shows an evaluation result indicating the area of the proposed FF is 11.4% smaller than that of a simple combination of the existing BISER and BILBO FFs. In addition, the sum of CLK-Q delay and D-CLK setup times on system operations for the proposed FF is 34.8% shorter than that for the combination.
ISBN 9781424484478
ISSN 15505774
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-10-06
Publisher Place Japan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 160.47 kB
Page Count 9
Starting Page 73
Ending Page 81

Source: IEEE Xplore Digital Library