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Author Wenjun Liu ♦ Sadeghipour, S.M. ♦ Asheghi, M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2006
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Thermal conductivity ♦ Analytical models ♦ Wires ♦ Boltzmann equation ♦ Transistors ♦ Reflection ♦ Optical films ♦ Semiconductor films ♦ Electric resistance ♦ Thermal resistance
Abstract This paper presents an analytical model for the size effect in rectangular cross-section metal wires based on a solution to the Boltzmann transport equation (BTE). The results are verified with the solution at the limiting cases of thin film and square cross section wire with various specular reflection coefficients at the film boundaries and agree well. In addition, a simple model was developed that can be conveniently used to approximate the exact solution of the BTE. These results can be used for the predictions of the electrical resistance and/or thermal conductivity of the metal as well as semiconductor nanostructures
Description Author affiliation: Dept. of Aerosp. & Mech. Eng., Notre Dame Univ., IN (Wenjun Liu)
ISBN 0780395247
ISSN 10879870
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-05-30
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 569.51 kB
Page Count 7
Starting Page 1292
Ending Page 1298

Source: IEEE Xplore Digital Library