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Author Krishna N., Sri Hari ♦ Seung Woo Son ♦ Kandemir, M. ♦ Feihui Li
Sponsorship Chinese Inst. of Electron
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2005
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword Embedded system ♦ Computer errors ♦ Hardware ♦ Error correction ♦ Computer science ♦ Benchmark testing ♦ Semiconductor devices ♦ Logic devices ♦ Software measurement
Abstract Ever scaling process technology makes embedded systems more vulnerable to soft errors than in the past. One of the generic methods used to fight soft errors is based on duplicating instructions either in the spatial or temporal domain and then comparing the results to see whether they are different. This full duplication based scheme, though effective, is very expensive in terms of performance, power, and memory space. In this paper, we propose an alternate scheme based on loop invariants and present experimental results which show that our approach catches 62% of the errors caught by full duplication, when averaged over all benchmarks tested. In addition, it reduces the execution cycles and memory demand of the full duplication strategy by 80% and 4%, respectively.
Description Author affiliation: Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., USA (Sri Hari Krishna N; Seung Woo Son; Kandemir, M.; Feihui Li)
ISBN 0780387368
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-01-21
Publisher Place China
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 720.41 kB
Page Count 4
Starting Page 1317
Ending Page 1320


Source: IEEE Xplore Digital Library