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Author Huaxing Tang ♦ Chen Liu ♦ Wu-Tung Cheng ♦ Reddy, S.M. ♦ Wei Zou
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2007
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Dictionaries ♦ Fault diagnosis ♦ USA Councils ♦ Circuit testing ♦ Throughput ♦ Graphics ♦ Cities and towns ♦ Manufacturing industries ♦ Very large scale integration ♦ Chip scale packaging
Abstract Effect-cause diagnosis procedures are the most commonly used in industry to diagnose VLSI circuits that fail manufacturing test or field applications. Fast and effective diagnosis procedures are essential to diagnose large numbers of failing dies for yield ramp-up. We have recently proposed a method to speed up effect-cause diagnosis procedures by using a dictionary of small size [26]. In this paper we propose methods to further reduce the dictionary size and still achieve higher performance. Experiments on several industrial designs demonstrate that, on average, effect-cause diagnosis procedures can be speeded up by 3.5X while requiring minimal memory overhead for a very small dictionary.
Description Author affiliation: Mentor Graphics Corp., Wilsonville (Huaxing Tang)
ISBN 9780769528908
ISSN 10817735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2007-10-08
Publisher Place China
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 263.86 kB
Page Count 7
Starting Page 281
Ending Page 287


Source: IEEE Xplore Digital Library