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Author Fritzsche, W.A. ♦ Haque, A.E.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2008
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Costs ♦ Pins ♦ Instruments ♦ System testing ♦ Circuit testing ♦ Jitter ♦ Protocols ♦ Built-in self-test ♦ Hardware ♦ Power system modeling
Abstract Loopback has always been a choice in testing multi-GBit device pins. It typically involves compromise in test coverage. This paper describes an instrument providing low-cost test capability for these pins which eliminates test compromises.
Description Author affiliation: Credence Syst. Corp., Milpitas, CA (Fritzsche, W.A.; Haque, A.E.)
ISBN 9781424424023
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2008-10-28
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 431.98 kB
Page Count 8
Starting Page 1
Ending Page 8


Source: IEEE Xplore Digital Library