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Author Joseph, J.
Sponsorship IEEE Educ. Soc. ♦ IEEE Comput. Soc. ♦ American Soc. for Eng. Educ. (Educ. Res. and Method Div.)
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2003
Language English
Subject Domain (in DDC) Social sciences ♦ Education ♦ Technology ♦ Engineering & allied operations
Subject Keyword Design engineering ♦ Systems engineering and theory ♦ Embedded system ♦ System testing ♦ Technology management ♦ Engineering management ♦ Explosives ♦ Very large scale integration ♦ Software engineering ♦ Computer peripherals
Abstract Oregon Institute of Technology is the only public institute of technology in the Pacific Northwest, providing degree programs in engineering, management, communications, and applied sciences, that prepare students to be effective participants in their professional, public, and international communities. The Computer Systems Engineering Technology [CSET] department of Oregon Institute of Technology has a set of courses meeting the capstone design experience required under ABET. With a view to prepare students for the capstone design experience, a series of courses entitled Junior Projects were added to the curriculum. Thanks to the explosive developments in VLSI, the projects undertaken by students in their junior year have become complex and innovative. This paper describes the challenges faced by the author while supervising projects that were not only innovative but also patentable. It throws light on possible solutions to those challenges.
Description Author affiliation: Dept. of CSET, Oregon Inst. of Technol., Klamath Falls, OR, USA (Joseph, J.)
ISBN 0780379616
ISSN 01905848
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2003-11-05
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 208.86 kB

Source: IEEE Xplore Digital Library