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Author Swanson, R. ♦ Wong, A. ♦ Ethirajan, S. ♦ Majumdar, A.
Sponsorship IEEE Counc. Electron. Design Autom.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2014
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Transistors ♦ Monitoring ♦ Resistance ♦ Testing ♦ Power supplies ♦ Regulators ♦ Circuit faults ♦ Probe-tip burnout ♦ Shorts testing ♦ Internally regulated power supply ♦ Power gating
Abstract A new industry-wide trend is the presence of multiple on-die power-supplies that are not directly connected to external supplies. Examples are internally-regulated supplies and power-gated supplies. This trend has brought to fore, the problem of testing for shorts between such internal supply grids and other (internal or external) supply grids. Today, presence of such shorts often results in excessive current draw from the tester and eventually results in burnt probe-tips adding to the overall cost of test. This paper proposes a classification of shorts defects involving internally regulated supplies. Two classes of solutions for mitigating or eliminating the problem are described. Methods for maximizing sensitivity of the solutions under leakage and probe-tip constraints are also described.
Description Author affiliation: Xilinx Inc., San Jose, CA, USA (Swanson, R.; Wong, A.; Ethirajan, S.; Majumdar, A.)
ISBN 9781479934157
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2014-05-26
Publisher Place Germany
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 483.33 kB
Page Count 6
Starting Page 1
Ending Page 6

Source: IEEE Xplore Digital Library