Thumbnail
Access Restriction
Subscribed

Author Das, D. ♦ Sinha, A. ♦ Chakravarty, K. ♦ Konar, A.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2013
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Special computer methods
Subject Keyword Clustering algorithms ♦ Indexes ♦ Accuracy ♦ Partitioning algorithms ♦ Stability criteria ♦ Iris ♦ Cancer ♦ Stability ♦ Fuzzy c-Means ♦ Clustering ♦ Component ♦ Dimensionality reduction
Abstract This paper proposes an extension of the traditional Fuzzy c-Means algorithm by allowing each component of the datapoints to independently contribute in the decision-making process of determining the cluster membership of the point. The above extension results in an improved accuracy in clustering. The second interesting issue undertaken here is to determine the optimum fuzziness control parameter for stabilization of the cluster centers. Lastly, the proposed extension helps in identifying the important dimensions in characterization of the datapoints. Experimental runs indicate an improvement in accuracy of clustering by the proposed algorithm in comparison to the traditional Fuzzy c-Means, with respect to the measure $F_{measure}$ parameter by 26, 15 and 6 percentage on Colon cancer, Wine and Wisconsin Diagnostic Breast Cancer (WDBC) datasets respectively.
Description Author affiliation: Innovation Lab., Tata Consultancy Services Ltd., Kolkata, India (Das, D.; Sinha, A.; Chakravarty, K.) || Dept. of Electron. & Tele-Commun. Eng., Jadavpur Univ., Kolkata, India (Konar, A.)
ISSN 10987584
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2013-07-07
Publisher Place India
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781479900220
Size (in Bytes) 185.40 kB
Page Count 8
Starting Page 1
Ending Page 8


Source: IEEE Xplore Digital Library