Access Restriction

Author Faust, M.G.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1998
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Testing ♦ Decision support systems ♦ Fiber reinforced plastics ♦ Virtual reality
Abstract This paper briefly reviews the value of Iddq testing and the challenges it presents traditional ATE hardware and software. It then describes several new hardware and software innovations to support Iddq testing and other Idd measurements which have been incorporated into a commercial ATE system.
Description Author affiliation: Credence Syst. Corp., Beaverton, OR, USA (Faust, M.G.)
ISBN 0818682779
ISSN 10817735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1998-12-02
Publisher Place Singapore
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 418.74 kB
Page Count 5
Starting Page 153
Ending Page 157

Source: IEEE Xplore Digital Library