Access Restriction

Author Anantharam, V.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1989
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Other branches of engineering
Subject Keyword Stability ♦ Protocols ♦ Feedback ♦ Solid modeling ♦ Information theory ♦ Distributed control ♦ Throughput
Abstract Consideration is given to a version of the discrete-time slotted ALOHA protocol operating with finitely many buffered terminals. The stability region is defined to be the set of vectors of arrival rates lambda =( lambda /sub 1/, . . ., lambda /sub M/) for which there exists a vector of transmission probabilities such that the system is stable. It is assumed that arrivals are independent from slot to slot and that the total number or arrivals in any slot is geometrically distributed, with the probability that such an arrival is at node i being lambda /sub i// Sigma lambda /sub k/, over all k, independent of others. With this arrival model it is proved that the closure of the stability region of the protocol is the same as the Shannon capacity region of the collision channel without feedback. The basic probabilistic observation is that the stationary distribution and certain conditional distributions derived from it have positive correlations for bounded increasing functions. Similar techniques may be of use in studying other interacting system of queues. At present it is not clear if the result depends on the choice of arrival distribution.<<ETX>>
Description Author affiliation: Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA (Anantharam, V.)
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1989-12-13
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 496.41 kB
Page Count 6
Starting Page 579
Ending Page 584

Source: IEEE Xplore Digital Library