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Author Gillman, E. S. ♦ Baker, J. ♦ Hernandez, J. J. ♦ Bishop, G. G. ♦ Li, J. A. ♦ Safron, S. A. ♦ Skofronick, J. G. ♦ Bonart, D. ♦ Schroeder, U.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ POTASSIUM BROMIDES ♦ CRYSTAL GROWTH ♦ EPITAXY ♦ RUBIDIUM CHLORIDES ♦ INELASTIC SCATTERING ♦ HELIUM 4 BEAMS ♦ SURFACE PROPERTIES ♦ BRILLOUIN ZONES
Abstract High-resolution helium-atom scattering experiments were performed on epitaxially grown layers of KBr on a RbCl(001) substrate for films 1, 2, and 3 ML thick. The layer-by-layer growth was monitored {ital in} {ital situ} by measuring the intensity of the specularly scattered He beam versus coverage. Measurements of the single-phonon inelastic scattering were carried out on each succeeding layer to determine the surface-phonon dispersion in both the {Gamma}{ital M} and {Gamma}{ital X} high-symmetry directions of the surface Brillouin zone. Shell-model potential parameters were determined in a consistent fashion for the four anion-cation constituents at the interface, which gave a good fit to the dispersion curve data from 1-, 2-, and 3-ML KBr/RbCl epitaxially grown systems as reported in this study and, in addition, the bulk and clean surface dispersions of KBr, RbCl, KCl, and RbBr were fit by the same parameters. {copyright} {ital 1996 The American Physical Society.}
ISSN 01631829
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-05-01
Publisher Place United States
Journal Physical Review, B: Condensed Matter
Volume Number 53
Issue Number 20


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