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Author Utter, S. B. ♦ Beiersdorfer, P. ♦ Lopez-Urrutia, J. R. ♦ Traebert, E.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword PLASMA PHYSICS AND FUSION ♦ SPECTROMETERS ♦ TRAPS ♦ ELECTRON BEAMS ♦ ULTRAVIOLET SPECTROMETERS ♦ PLASMA DIAGNOSTICS ♦ VISIBLE SPECTRA ♦ GRATINGS ♦ DESIGN ♦ ARGON ♦ KRYPTON ♦ EXTREME ULTRAVIOLET SPECTRA
Abstract Spectroscopic instrumentation is one of the keys to the exploration of high-temperature plasmas. The electron beam ion trap (EBIT) can serve as a tool for precise studies of highly charged ions in the laboratory and can help in setting spectroscopic standards for plasma studies. Recent efforts have focused on investigating the EUV, vacuum ultraviolet (VUV), and UV regimes. We present here the implementation of a 1 m normal incidence spectrometer for use on the Lawrence Livermore National Laboratory high-energy EBIT (Super-EBIT) for spectral analysis of line emission of highly charged ions. Using two different gratings, our study encompasses a wide range of wavelengths spanning the VUV through the visible. Examples of measurements of optical spectra from krypton and argon are given. {copyright} {ital 1999 American Institute of Physics.}
ISSN 00346748
Educational Use Research
Learning Resource Type Article
Publisher Date 1999-01-01
Publisher Place United States
Journal Review of Scientific Instruments
Volume Number 70
Issue Number 1
Technical Publication No. CONF-980605-


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