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Author Nagaraj, B. ♦ Aggarwal, S. ♦ Ramesh, R.
Sponsorship (US)
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Publisher The American Physical Society
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ CHARGE CARRIERS ♦ ELECTRODES ♦ LEAKAGE CURRENT ♦ TEMPERATURE DEPENDENCE ♦ THIN FILMS
Abstract Electrodes can impact the device performance of ferroelectric capacitors in several ways. The present controlled studies on Pb (Nb,Zr,Ti)O{sub 3} with Pt, (La,Sr)CoO{sub 3} and SrRuO{sub 3} is a clear demonstration of the role of electrodes in impacting the leakage current mechanism of the ferroelectric capacitors and their reliability properties. The oxide electrode capacitors show predominantly nonblocking contact and good fatigue and imprint properties. Pt electrode capacitors show blocking contacts, long term leakage current relaxation, and poor fatigue and imprint properties. The nature of the temperature and voltage dependence of leakage current relaxation in Pt capacitors indicates trapping of charge carriers to be the cause for the observed relaxation. A good correlation between leakage current relaxation and the rate of polarization loss during fatigue and the similarity in their voltage and temperature dependence suggests trapping (of charged carriers/domains, respectively) as common to both phenomena. {copyright} 2001 American Institute of Physics.
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 2001-07-01
Publisher Place United States
Journal Journal of Applied Physics
Volume Number 90
Issue Number 1


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