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Author Nilson, P. M. ♦ Ehrne, F. ♦ Mileham, C. ♦ Mastrosimone, D. ♦ Jungquist, R. K. ♦ Taylor, C. ♦ Stillman, C. R. ♦ Ivancic, S. T. ♦ Boni, R. ♦ Hassett, J. ♦ Lonobile, D. J. ♦ Kidder, R. W. ♦ Shoup, M. J. ♦ Solodov, A. A. ♦ Stoeckl, C. ♦ Theobald, W. ♦ Froula, D. H. ♦ Hill, K. W. ♦ Gao, L. ♦ Bitter, M.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ♦ CHARGE-COUPLED DEVICES ♦ CRYSTALS ♦ EMISSION ♦ EMISSION SPECTRA ♦ FOILS ♦ IRRADIATION ♦ KEV RANGE 01-10 ♦ LASERS ♦ PULSES ♦ SPHERICAL CONFIGURATION ♦ STREAK CAMERAS ♦ X RADIATION ♦ X-RAY SPECTRA ♦ X-RAY SPECTROMETERS ♦ X-RAY SPECTROSCOPY
Abstract A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu K{sub α1} line. To demonstrate the performance of the spectrometer under high-power conditions, K{sub α1,2} emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 10{sup 18} W/cm{sup 2}. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.
ISSN 00346748
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-11-15
Publisher Place United States
Journal Review of Scientific Instruments
Volume Number 87
Issue Number 11


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