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Author Welnak, J. T. ♦ Solak, H. ♦ Wallace, J. ♦ Cerrina, F. ♦ Barbo, F. ♦ Bertolo, M. ♦ Bianco, A. ♦ Di Fonzo, S. ♦ Fontana, S. ♦ Jark, W. ♦ Mazzolini, F. ♦ Rosei, R. ♦ Savoia, A. ♦ Underwood, J. ♦ Margaritondo, G.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword PARTICLE ACCELERATORS ♦ INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS ♦ SYNCHROTRON RADIATION SOURCES ♦ USES ♦ MICROSCOPES ♦ X RADIATION ♦ OPTICAL SYSTEMS ♦ DESIGN ♦ ALIGNMENT ♦ RADIATION FLUX
Abstract High brightness, third-generation synchrotrons allow diffraction-limited performance and large flux for scanning photoemission microscopes. A new microscope, SuperMAXIMUM, is being developed at the University of Wisconsin Center for X ray Lithography in collaboration with the Sincrotrone Trieste. The beamline, being built in Trieste, uses a variable angle spherical grating monochromator (VASGM). A combination of rotation of a plane mirror and rotation of the spherical grating keeps the slit positions and beam directions fixed. The microscope objectives are normal-incidence, multilayer-coated Schwarzschild objectives. The project, which is nearing completion, utilizes novel designs for optics alignment, sample rastering mechanics, and software control. We will discuss the project status, new designs, and techniques. {copyright} {ital 1996 American Institute of Physics.}
ISSN 00346748
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-09-01
Publisher Place United States
Journal Review of Scientific Instruments
Volume Number 67
Issue Number 9
Technical Publication No. CONF-9510119-


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