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Author Ning Hua Zhu ♦ Chen Qian ♦ You Lin Wang ♦ Pun, E.Y.B. ♦ Po-Shuen Chung
Sponsorship IEEE Microwave Theory and Techniques Society
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Frequency ♦ Calibration ♦ Testing ♦ Fixtures ♦ Equations ♦ Microwave devices ♦ Transmission lines ♦ Reflection ♦ Scattering parameters ♦ Microwave measurements
Abstract The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. For asymmetric test fixtures, a new algorithm based on the thru-short-match (TSM) method is outlined. It is found that the conventional TSM method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. This limitation can be avoided by using a different algorithm. The various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. Several ways in avoiding the problem are proposed. There is good agreement between the theories and experimental data.
Description Author affiliation :: State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China
ISSN 00189480
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2003-09-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 51
Issue Number 9
Size (in Bytes) 469.54 kB
Page Count 7
Starting Page 2000
Ending Page 2006

Source: IEEE Xplore Digital Library