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Author Sheng, K. C. ♦ Lee, S. J. ♦ Shen, Y. H. ♦ Rippert, E. D. ♦ Van Duyne, R. P. ♦ Ketterson, J. B.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ BARIUM OXIDES ♦ RAMAN SPECTROSCOPY ♦ COPPER OXIDES ♦ SUPERCONDUCTING FILMS ♦ YTTRIUM OXIDES ♦ ANNEALING ♦ CHEMICAL COMPOSITION ♦ CHEMICAL REACTIONS ♦ IMPURITIES ♦ LOW TEMPERATURE ♦ MAGNESIUM OXIDES ♦ MAGNETRONS ♦ PHYSICAL PROPERTIES ♦ SPUTTERING ♦ SUBSTRATES ♦ TRANSITION TEMPERATURE ♦ VERY LOW TEMPERATURE ♦ ALKALINE EARTH METAL COMPOUNDS ♦ BARIUM COMPOUNDS ♦ CHALCOGENIDES ♦ COPPER COMPOUNDS ♦ ELECTRON TUBES ♦ ELECTRONIC EQUIPMENT ♦ EQUIPMENT ♦ FILMS ♦ HEAT TREATMENTS ♦ LASER SPECTROSCOPY ♦ MAGNESIUM COMPOUNDS ♦ MICROWAVE EQUIPMENT ♦ MICROWAVE TUBES ♦ OXIDES ♦ OXYGEN COMPOUNDS ♦ SPECTROSCOPY ♦ THERMODYNAMIC PROPERTIES ♦ TRANSITION ELEMENT COMPOUNDS ♦ YTTRIUM COMPOUNDS ♦ Ceramics, Cermets, & Refractories- Preparation & Fabrication ♦ Ceramics, Cermets, & Refractories- Structure & Phase Studies ♦ Ceramics, Cermets, & Refractories- Physical Properties
Abstract Raman spectroscopy was employed to study Y-Ba-Cu-O films prepared by multilayer, reactive sputtering from separate Y, Cu, and Ba{sub 0.5}Cu{sub 0.5} targets. A set of films having the composition Y{sub {ital x}}Ba{sub 2}Cu{sub {ital y}}O{sub {ital z}} with 0.7{lt}{ital x}{lt}1.8 and 2.8{lt}{ital y}{lt}3.5 and critical temperature with zero resistance, {ital T}{sub {ital c}}({ital R}=0), ranging from 25 to 90 K was studied with the Raman technique. The correlation between Raman data and critical temperature, {ital T}{sub {ital c}}, was investigated. This technique provides important information concerning the film crystallinity, homogeneity, and impurity content (including other phases) which is useful in judging the quality of high {ital T}{sub {ital c}} superconducting films. We also found that the rapid thermal annealing process is a very efficient way to reduce chemical reactions between the film and the substrate.
ISSN 08842914
Educational Use Research
Learning Resource Type Article
Publisher Date 1989-11-01
Publisher Place United States
Journal Journal of Materials Research
Volume Number 4
Issue Number 6


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