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Author Subramanian, B. ♦ Sanjeeviraja, C. ♦ Jayachandran, M.
Source CSIR-Central Electrochemical Research Institute
Content type Text
Publisher Elsevier
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Chemistry & allied sciences ♦ Physical chemistry
Subject Keyword Electrochemical Materials Science
Abstract Brush plating technique has been adopted for the first time to coat tin selenide thin film on tin oxide coated conducting substrates at room temperature, 501C and 601C. Uniform and pinhole free films were deposited at potentials 5.0 V. XRD analyses show the polycrystalline nature of the films with orthorhombic structure. Optical studies show the indirect nature with a bandgap of 1.0 eV. SEM pictures show smooth and uniform surface morphology with a grain size of about 0.3 mm. Film roughness was characterized by atomic force microscopy. Mott–Schottky plot has been drawn to evaluate the semiconductor parameters.
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2002-01-01
Journal PeerReviewed