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Author Divakara, S. ♦ Madhu, S. ♦ Somashekar, R.
Source CSIR-Central Electrochemical Research Institute
Content type Text
Publisher Indian Academy of Sciences
File Format PDF
Copyright Year ©2009
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Electrochemical Instrumentation
Abstract We have analysed the broadening of X-ray reflections observed in nonmulberry silk fibres in terms of stacking faults and microstructural parameters using a single-order method and have, with these parameters, developed, for the first time, a procedure to compute the whole pattern of these silk fibres. The essential deviations in the values of microstructural parameters obtained from line profile and whole pattern fitting procedures are discussed in this paper.
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-01-01
Journal PeerReviewed