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Author Nayak, N. U. ♦ Sureshbapu, R. H. ♦ Nalini, T. ♦ Shanbhogue, H. V. ♦ Mahadevaiyer, Y.
Source CSIR-Central Electrochemical Research Institute
Content type Text
File Format PDF
Copyright Year ©1998
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Electrochemical Instrumentation
Abstract A statistical eddy current thickness meter has been developed based on Intel 8085 microprocessor system. Two separate measuring probes have been designed to measure the thickness of coatings on non-magnetic and magnetic substrates. The performance of the instrument has been evaluated by using it to measure the thickness of different coatings on different substrates.
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1998-01-01
Journal PeerReviewed