Thumbnail
Access Restriction
Open

Author Bertero, G. A. ♦ Sinclair, R. ♦ Park, C. ♦ Shen, Z. X.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ PLATINUM ♦ THIN FILMS ♦ COBALT ♦ INTERFACES ♦ SPUTTERING ♦ MAGNETO-OPTICAL EFFECTS ♦ STRUCTURAL CHEMICAL ANALYSIS ♦ TRANSMISSION ELECTRON MICROSCOPY ♦ X-RAY DIFFRACTION ♦ MAGNETIC CIRCULAR DICHROISM
Abstract Pt/Co multilayers sputter-deposited in Ar and Xe ambients, and periodic multilayers composed of specific combinations of Pt, Pd, and Co layers, were grown to study the effects of energetic backscattered Ar neutrals on the interface structure. The effects were correlated with the magnetic and magneto-optical properties with emphasis on the perpendicular magnetic anisotropy, {ital K}{sub {perpendicular}}. Films were characterized by high-resolution transmission electron microscopy, x-ray diffraction including grazing incidence geometry, and magnetic circular x-ray dichroism techniques as well as by standard magnetic and magneto-optic methods. It is found that the perpendicular magnetic anisotropy is extremely sensitive to the degree of intermixing, sharp interfaces yielding the largest anisotropy. The three to fourfold difference in {ital K}{sub {perpendicular}} found between Ar and Xe sputtered films can be directly correlated to the magnitude of the orbital moment contribution {l_angle}{ital L}{sub {ital Z}}{r_angle} in the Co. This orbital contribution is found to be strongly sensitive to the interface sharpness in the films.
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 1995-04-15
Publisher Place United States
Journal Journal of Applied Physics
Volume Number 77
Issue Number 8


Open content in new tab

   Open content in new tab