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Author Habuchi, T. ♦ Tsutsui, H. ♦ Tsuji-Iio, S. ♦ Shimada, R.
Sponsorship Council on Superconductivity ♦ Appl. Superconductivity Conference Inc ♦ MIT
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Stress ♦ Coils ♦ Toroidal magnetic fields ♦ Magnetic field induced strain ♦ Finite element methods ♦ Fusion reactor design ♦ Electromagnetic modeling ♦ Magnetic confinement ♦ Electromagnetic forces ♦ Distributed computing ♦ virial limit coil ♦ Electromagnetic stress ♦ FEM ♦ force-balanced coil
Abstract We computed the virial-limit coils which level the distribution of electromagnetic stress with a uniaxial model and a finite element method model. The model's helical pitch number, N = 3, the aspect ratio, A = 2.17, and the number of coils was 8. In order to compare with other coil windings, we analysed additional two model coils whose aspect ratios are 1.68 and 3.0 with the same pitch number and the number of coils. We confirmed that VLCs achieve nearly uniform stress distribution from both analyses. And we found that large bending stress is generated in coils from FEM analysis. Distribution of bending stress was found to be different depending on the aspect ratio. The strain in the thickness direction is predominant with a lower aspect ratio while the strain in the width direction is largest with large one.
Description Author affiliation :: Res. Lab. for Nucl. Reactors, Tokyo Inst. of Technol., Tokyo, Japan
ISSN 10518223
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-06-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 20
Issue Number 3
Size (in Bytes) 431.57 kB
Page Count 4
Starting Page 1924
Ending Page 1927


Source: IEEE Xplore Digital Library