Access Restriction

Author Cohen, Myra B. ♦ Yilmaz, Cemal ♦ Porter, Adam
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Software testing ♦ Fault characterization ♦ Distributed continuous quality assurance ♦ Covering arrays
Abstract Testing systems with large configurations spaces that change often is a challenging problem. The cost and complexity of QA explodes because often there isn't just one system, but a multitude of related systems. Bugs may appear in certain configurations, but not in others.The Skoll system and process has been developed to test these types of systems through distributed, continuous quality assurance, leveraging user resources around-the-world, around-the-clock. It has been shown to be effective in automatically characterizing configurations in which failures manifest. The derived information helps developers quickly narrow down the cause of failures which then improves turn around time for fixes. However, this method does not scale well. It requires one to exhaustively test each configuration in the configuration space.In this paper we examine an alternative approach. The idea is to systematically sample the configuration space, test only the selected configurations, and conduct fault characterization on the resulting data. The sampling approach we use is based on calculating a mathematical object called a covering array. We empirically assess the effect of using covering array derived test schedules on the resulting fault characterizations and provide guidelines to practitioners for their use.
Description Affiliation: University of Auckland, Auckland, New Zealand (Cohen, Myra B.) || University of Maryland, College Park, Maryland (Yilmaz, Cemal; Porter, Adam)
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1979-04-01
Publisher Place New York
Journal ACM SIGSOFT Software Engineering Notes (SOEN)
Volume Number 29
Issue Number 4
Page Count 10
Starting Page 45
Ending Page 54

Open content in new tab

   Open content in new tab
Source: ACM Digital Library