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Author Palsberg, Jens ♦ Brylow, Dennis
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Testing oracles ♦ Real time ♦ Multi-resolution static analysis
Abstract Real-time, reactive, and embedded systems are widely used throughout society (e.g., flight control, railway signaling, vehicle management, medical devices, and many others). For real-time, interrupt-driven software, timely interrupt handling is part of correctness. It is vital for software verification in such systems to check that all specified deadlines for interrupt handling will be met. Such verification is a daunting task because of the large number of different possible interrupt arrival scenarios. For example, for a Z86-based microcontroller, there can be up to six interrupt sources and each interrupt can arrive during any clock cycle. Verification of such systems has traditionally relied upon lengthy and tedious testing; even under the best of circumstances, testing is likely to cover only a fraction of the state space in interrupt-driven systems.This paper presents a tool for deadline analysis of interrupt-driven Z86-based software. The main idea is to use static analysis to significantly decrease the required testing effort by automatically identifying and isolating the segments of code that need the most testing. Our tool combines multi-resolution static analysis and testing oracles in such a way that only the oracles need to be verified by testing. Each oracle specifies the worst-case execution time from one program point to another, which is then used by the static analysis to improve precision. For six commercial microcontroller systems, our experiments show that a moderate number of testing oracles are sufficient to do precise deadline analysis.
Description Affiliation: Purdue University, West Lafayette, IN (Brylow, Dennis; Palsberg, Jens)
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1979-04-01
Publisher Place New York
Journal ACM SIGSOFT Software Engineering Notes (SOEN)
Volume Number 28
Issue Number 5
Page Count 10
Starting Page 198
Ending Page 207


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Source: ACM Digital Library